Handbook of Microwave Component Measurements: with Advanced VNA Techniques, 2/e (Hardcover)

Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.

《微波元件測量手冊》第二版是一本完全更新的參考書，專注於現代測量工具，如矢量網絡分析儀（VNA），將所有測量科學的概念、公式和最佳實踐集中在一個地方。每個章節都包含基本概念，附錄提供了理解微波測量科學背後的所有細節所需的資訊。本書提供了確定被測物件（DUT）真實性質的最佳實踐，優化設置和測量時間，並在最大程度上消除測量設備對結果的影響。此外，作者以簡潔易懂的方式撰寫，使學生或新工程師能夠輕鬆理解，同時也提供了測量科學的詳細資訊，適用於最先進的應用和研究。這本令人期待的新版介紹了當今工業中使用的最新技術，並承認自2012年第一版出版以來已經發展出更多新技術。雖然仍然專注於VNA，但這些技術也與其他供應商的先進設備兼容，提供了全面的行業參考資料。

Dr. Joel P. Dunsmore, Research Fellow at Keysight Technologies, California, USA
Since graduating from Oregon State University with a BSEE (1982) and an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent Technologies, and Hewlett-Packard) at the Sonoma County Site. He received his Ph.D. from Leeds University in 2004. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in the area of non-linear test including differential devices, and mixer measurements. He has received 31 patents related to this work, has published numerous articles on measurement technology, as well as consulting on measurement applications. He has taught electrical circuit fundamentals at the local university and co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT, EMC, and Keysight.

美國加州Keysight Technologies的研究員Joel P. Dunsmore博士

Joel Dunsmore於1982年獲得俄勒岡州立大學的電機工程學士學位，並於1983年獲得碩士學位。自那時起，他一直在Sonoma County Site的Keysight Technologies（前身為Agilent Technologies和Hewlett-Packard）工作。他於2004年從利茲大學獲得博士學位。他是HP 8753和PNA系列網絡分析儀的主要貢獻者，負責這些產品中的射頻和微波電路設計。最近，他在非線性測試領域工作，包括差動器件和混頻器測量。他已獲得31項與此工作相關的專利，並發表了許多關於測量技術的文章，並在測量應用方面提供諮詢服務。他曾在當地大學教授電路基礎知識，並在加州大學伯克利分校共同教授射頻課程，並通過ARFTG、MTT、EMC和Keysight進行了幾個短期課程和研討會。