Advances in Applications of Rasch Measurement in Science Education
暫譯: 拉施測量在科學教育中的應用進展
Liu, Xiufeng, Boone, William J.
- 出版商: Springer
- 出版日期: 2024-08-02
- 售價: $6,440
- 貴賓價: 9.5 折 $6,118
- 語言: 英文
- 頁數: 529
- 裝訂: Quality Paper - also called trade paper
- ISBN: 3031287789
- ISBN-13: 9783031287787
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商品描述
This edited volume presents latest development in applications of Rasch measurement in science education. It includes a conceptual introduction chapter and a set of individual chapters. The introductory chapter reviews published studies applying Rasch measurement in the field of science education and identify important principles of Rasch measurement and best practices in applications of Rasch measurement in science education. The individual chapters, contributed by authors from Canada, China, Germany, Philippines and the USA, cover a variety of current topics on measurement concerning science conceptual understanding, scientific argumentation, scientific reasoning, three-dimensional learning, knowledge-in-use and cross-cutting concepts of the Next Generation Science Standards, medical education learning experiences, machine-scoring bias, formative assessment, and teacher knowledge of argument. There are additional chapters on advances in Rasch analysis techniquesand technology including R, Bayesian estimation, comparison between joint maximum likelihood (JML) and marginal maximum likelihood (MML) estimations on model-data-fit, and enhancement to Rasch models by Cognitive Diagnostic Models and Latent Class Analysis. The volume provides readers who are new and experienced in applying Rasch measurement with advanced and exemplary applications in the forefront of various areas of science education research.
商品描述(中文翻譯)
這本編輯的專著介紹了Rasch測量在科學教育應用中的最新發展。它包含了一個概念性介紹章節和一系列獨立的章節。介紹章節回顧了已發表的研究,這些研究應用了Rasch測量於科學教育領域,並確定了Rasch測量的重要原則及其在科學教育應用中的最佳實踐。獨立章節由來自加拿大、中國、德國、菲律賓和美國的作者貢獻,涵蓋了有關科學概念理解、科學論證、科學推理、三維學習、知識應用及下一代科學標準的跨領域概念、醫學教育學習經驗、機器評分偏差、形成性評估以及教師對論證的知識等多種當前測量主題。此外,還有關於Rasch分析技術和技術進展的附加章節,包括R、貝葉斯估計、聯合最大似然(JML)與邊際最大似然(MML)估計在模型數據擬合上的比較,以及通過認知診斷模型和潛在類別分析對Rasch模型的增強。本書為新手和有經驗的讀者提供了在各個科學教育研究領域前沿的Rasch測量的先進和典範應用。
作者簡介
Xiufeng Liu is a Professor of Science Education at University at Buffalo, and a Fellow of the American Association for the Advancement of Science (AAAS). He conducts research in applications of Rasch measurement in science education, particularly on conceptual learning and assessment. He is the author of Using and Developing Measurement Instruments in Science Education: A Rasch Modeling Approach (2nd Edition, IAP).
William Boone earned his Ph.D. from the University of Chicago's Program in Measurement, Evaluation and Statistical Analysis (Dept. of Education). He is the lead author of the two books- 1) Rasch Analysis in the Human Sciences, 2) Advances in Rasch Analysis in the Human Sciences. Professor Boone presents Rasch workshops throughout the world. Dr. Boone is a professor at Miami University (Oxford, Ohio, USA).
作者簡介(中文翻譯)
修峰劉是布法羅大學的科學教育教授,也是美國科學促進協會(AAAS)的會士。他的研究專注於Rasch測量在科學教育中的應用,特別是在概念學習和評估方面。他是《在科學教育中使用和開發測量工具:Rasch建模方法》(第二版,IAP)的作者。
威廉·布恩(William Boone)在芝加哥大學的測量、評估與統計分析計畫(教育系)獲得博士學位。他是兩本書的主要作者:1)《人文科學中的Rasch分析》,2)《人文科學中的Rasch分析進展》。布恩教授在全球各地舉辦Rasch工作坊。布恩博士是美國俄亥俄州邁阿密大學的教授。