3D IC Integration and Packaging (Hardcover)

John H. Lau

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商品描述

A comprehensive guide to 3D IC integration and packaging technology

 
3D IC Integration and Packaging fully explains the latest microelectronics techniques for increasing chip density and maximizing performance while reducing power consumption. Based on a course developed by its author, this practical guide offers real-world problem-solving methods and teaches the trade-offs inherent in making system-level decisions. Explore key enabling technologies such as TSV, thin-wafer strength measurement and handling, microsolder bumping, redistribution layers, interposers, wafer-to-wafer bonding, chip-to-wafer bonding, 3D IC and MEMS, LED, and complementary metal-oxide semiconductor image sensors integration. Assembly, thermal management, and reliability are covered in complete detail.
 
3D IC Integration and Packaging covers:
 
• 3D integration for semiconductor IC packaging
• Through-silicon vias modeling and testing
• Stress sensors for thin-wafer handling and strength measurement
• Package substrate technologies
• Microbump fabrication, assembly, and reliability
• 3D Si integration
• 2.5D/3D IC integration
• 3D IC integration with passive interposer
• Thermal management of 2.5D/3D IC integration
• Embedded 3D hybrid integration
• 3D LED and IC integration
• 3D MEMS and IC integration
• 3D CMOS image sensors and IC integration
• PoP, chip-to-chip interconnects, and embedded fan-out WLP

商品描述(中文翻譯)

一本關於3D IC整合和封裝技術的全面指南

《3D IC整合和封裝》全面解釋了最新的微電子技術,以增加晶片密度、最大化性能並降低功耗。本書基於作者開發的課程,提供實際解決問題的方法,並教授在系統層面做出決策時所需的權衡。探索關鍵的啟用技術,如TSV、薄晶圓強度測量和處理、微焊點鍍覆、再分配層、中間接合層、晶圓對晶圓接合、晶片對晶圓接合、3D IC和MEMS、LED以及互補金屬氧化物半導體影像感測器整合。本書詳細介紹了組件、熱管理和可靠性等內容。

《3D IC整合和封裝》包括以下內容:

- 半導體IC封裝的3D整合
- 通過矽通孔的建模和測試
- 用於薄晶圓處理和強度測量的應力感測器
- 封裝基板技術
- 微焊點製造、組件和可靠性
- 3D矽整合
- 2.5D/3D IC整合
- 帶有被動中間接合層的3D IC整合
- 2.5D/3D IC整合的熱管理
- 嵌入式3D混合整合
- 3D LED和IC整合
- 3D MEMS和IC整合
- 3D CMOS影像感測器和IC整合
- PoP、晶片對晶片互連和嵌入式扇出WLP