Pragmatic Unit Testing in C# with NUnit, 2/e (Paperback)

Andy Hunt, Dave Thomas, Matt Hargett

買這商品的人也買了...

商品描述

Book Description

The NIST estimates that poor testing costs the US economy $60 billion annually. This book gives teams straightforward and proven ways to introduce unit testing into their process, resulting in higher quality and fewer bugs.

All over the world, software teams are using unit testing both to verify their code and as a way of helping them design better code. This book is unique in the way it covers two aspects: showing developers both how to test and helping them determine what to test.

New in the second edition:

  • Updated for NUnit 2.4 (.NET 2.0 and Visual Studio 2005)
  • More assert methods
  • New String and Collection assertion support
  • Better support for multiple-platform development
  • Higher-level setup and teardown fixtures
  • Whole new chapter on extending NUnit
  • and more!

 

商品描述(中文翻譯)

書籍描述:

美國國家標準與技術研究院(NIST)估計,糟糕的測試每年給美國經濟造成600億美元的損失。本書提供團隊們直接且經過驗證的方法,將單元測試引入他們的流程中,從而提高質量並減少錯誤。

全球各地的軟體團隊都在使用單元測試來驗證他們的程式碼,並作為幫助他們設計更好程式碼的方式。本書在兩個方面獨具特色:一方面向開發人員展示如何進行測試,另一方面幫助他們確定應該測試什麼。

第二版的新增內容包括:
- 適用於 NUnit 2.4(.NET 2.0和Visual Studio 2005)
- 更多斷言方法
- 新增對字串和集合的斷言支援
- 更好地支援多平台開發
- 更高層次的設置和拆卸夾具
- 全新的章節介紹如何擴展 NUnit
- 等等!