Statistical Process Control Demystified (Paperback)
暫譯: 統計過程控制揭秘 (平裝本)
Paul A. Keller
- 出版商: McGraw-Hill Education
- 出版日期: 2011-08-09
- 定價: $875
- 售價: 8.0 折 $700
- 語言: 英文
- 頁數: 320
- 裝訂: Paperback
- ISBN: 0071742492
- ISBN-13: 9780071742498
-
相關分類:
機率統計學 Probability-and-statistics、Data Science
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相關主題
商品描述
INCREASE your odds of learning STATISTICAL process control (SPC)
Identify and reduce variation in business processes using SPC--the powerful analysis tool for process evaluation and improvement. Statistical Process Control Demystified shows you how to use SPC to enable data-driven decision making and gain a competitive advantage in the marketplace.
Written in a step-by-step format, this practical guide explains how to analyze process data, collect data, and determine the suitability of a process in meeting requirements. Attribute and X-bar control charts are discussed, as are charts for individuals data. You'll also get details on process improvement and measurement systems analysis. Detailed examples, calculations, and statistical assumptions make it easy to understand the material, and end-of-chapter quizzes and a final exam help reinforce key concepts.
It's a no-brainer! You'll learn about:
- Control chart interpretation
- Overcoming common errors in the use of SPC and general statistical analysis tools
- Sampling requirements
- Analysis using Excel
- Estimating process variation
- Designed experiments
- Measurement systems analysis, including R&R studies
- Continuous process improvement strategies
Simple enough for a beginner, but challening enough for an advanced student, Statistical Process Control Demystified is your shortcut to this powerful analysis solution.
商品描述(中文翻譯)
提高學習統計過程控制 (SPC) 的機會
使用 SPC 這個強大的分析工具來識別和減少商業流程中的變異,進行流程評估和改進。《統計過程控制解密》將教你如何使用 SPC 來實現數據驅動的決策,並在市場上獲得競爭優勢。
本書以逐步的格式撰寫,實用指南解釋了如何分析過程數據、收集數據以及確定一個過程是否符合要求。書中討論了屬性控制圖和 X-bar 控制圖,以及個體數據的圖表。你還將獲得有關流程改進和測量系統分析的詳細資訊。詳細的範例、計算和統計假設使得理解材料變得容易,而每章結尾的測驗和期末考試有助於鞏固關鍵概念。
這是個明智的選擇!你將學到:
- 控制圖解釋
- 克服使用 SPC 和一般統計分析工具中的常見錯誤
- 抽樣要求
- 使用 Excel 進行分析
- 估算過程變異
- 設計實驗
- 測量系統分析,包括 R&R 研究
- 持續過程改進策略
對初學者來說足夠簡單,但對進階學生來說又足夠具挑戰性,《統計過程控制解密》是你通往這個強大分析解決方案的捷徑。