Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (美國原版)

Dennis Derickson, Marcus Müller

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商品描述

A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before璽??information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.

Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.

Coverage includes

  • Signal integrity from a measurement point of view
  • Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes
  • Bit error ratio measurements for both electrical and optical links
  • Extensive coverage on the topic of jitter in high-speed networks
  • State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals
  • Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing
  • Channel and system characterization: TDR/T and frequency domain-based alternatives
  • Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM

商品描述(中文翻譯)

《數位通訊連結物理層測試與量測全面指南》

今天的新數據通訊和電腦互連系統運行速度前所未有,不僅在設計上面臨新的挑戰,也在故障排除、測試和量測方面面臨新的挑戰。本書匯集了來自頂尖測試和量測公司、元件製造商和大學的專業人士的貢獻。它匯集了以前從未廣泛獲得的資訊,這些資訊以前埋藏在應用筆記、研討會和會議報告、短期課程和未發表的著作中。

讀者將深入了解數位高速系統的內部運作方式,並學習如何測試這些系統的不同方面。編者和貢獻者涵蓋了發射機(數位波形和抖動分析以及位元錯誤率)、接收機(靈敏度、抖動容忍度和PLL/CDR特性)和高速通道特性(時間和頻率域)的關鍵領域。全書提供了大量插圖。

內容包括:

- 從測量角度看信號完整性
- 使用高頻寬實時和取樣(等效時間)示波器進行數位波形分析
- 電氣和光學連結的位元錯誤率測量
- 高速網絡中抖動的廣泛涵蓋
- 用於分析100 Gbit/s +信號的最新光學取樣技術
- 接收機特性:時鐘恢復、鎖相環、抖動容忍度和傳輸函數、靈敏度測試和壓力波形接收機測試
- 通道和系統特性:時域反射/傳輸率和頻域替代方案
- 測試和量測PC架構通訊連結:PCIexpress、SATA和FB DIMM