Statistical Control by Monitoring and Adjustment 2nd Edition

George E. P. Box, Alberto Luceño, Maria del Carmen Paniagua-Quinones

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Praise for the First Edition

"This book . . . is a significant addition to the literature on statistical practice . . . should be of considerable interest to those interested in these topics."—International Journal of Forecasting

Recent research has shown that monitoring techniques alone are inadequate for modern Statistical Process Control (SPC), and there exists a need for these techniques to be augmented by methods that indicate when occasional process adjustment is necessary. Statistical Control by Monitoring and Adjustment, Second Edition presents the relationship among these concepts and elementary ideas from Engineering Process Control (EPC), demonstrating how the powerful synergistic association between SPC and EPC can solve numerous problems that are frequently encountered in process monitoring and adjustment.

The book begins with a discussion of SPC as it was originally conceived by Dr. Walter A. Shewhart and Dr. W. Edwards Deming. Subsequent chapters outline the basics of the new integration of SPC and EPC, which is not available in other related books. Thorough coverage of time series analysis for forecasting, process dynamics, and non-stationary models is also provided, and these sections have been carefully written so as to require only an elementary understanding of mathematics. Extensive graphical explanations and computational tables accompany the numerous examples that are provided throughout each chapter, and a helpful selection of problems and solutions further facilitates understanding.

Statistical Control by Monitoring and Adjustment, Second Edition is an excellent book for courses on applied statistics and industrial engineering at the upper-undergraduate and graduate levels. It also serves as a valuable reference for statisticians and quality control practitioners working in industry.

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第一版的好評如潮

「這本書……是統計實踐文獻中的重要補充……對於對這些主題感興趣的人來說,應該非常有興趣。」—《國際預測期刊》

最近的研究表明,單獨使用監控技術對於現代統計過程控制(SPC)是不足夠的,需要這些技術與指示何時需要偶爾調整過程的方法相結合。第二版的《統計控制與監控調整》展示了這些概念之間的關係,以及來自工程過程控制(EPC)的基本思想,展示了SPC和EPC之間強大的協同關係如何解決在過程監控和調整中經常遇到的問題。

本書首先討論了Walter A. Shewhart博士和W. Edwards Deming博士最初構思的SPC。隨後的章節概述了SPC和EPC的新整合基礎,這在其他相關書籍中是不可得的。本書還提供了關於時間序列分析、過程動態和非穩態模型的全面覆蓋,這些部分的撰寫非常注重只需要基本的數學理解。每章節都配有詳細的圖形解釋和計算表格,並提供了大量的例子,有助於理解。此外,書中還提供了一系列問題和解答,進一步促進理解。

《統計控制與監控調整》第二版是應用統計學和工業工程的高年級本科和研究生課程的優秀教材。對於在工業界工作的統計學家和品質控制從業人員來說,它也是一本有價值的參考書。