Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures

D. B. Holt, B. G. Yacobi

  • 出版商: Cambridge
  • 出版日期: 2007-04-12
  • 售價: $2,400
  • 貴賓價: 9.8$2,352
  • 語言: 英文
  • 頁數: 644
  • 裝訂: Hardcover
  • ISBN: 0521819342
  • ISBN-13: 9780521819343
  • 相關分類: 半導體
  • 下單後立即進貨 (約5~7天)

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商品描述

Description

Covering topics that are especially important in electronic device development, this book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Table of Contents

1. Semiconducting materials;

2. An introduction to extended defects;

3. Characterization of extended defects in semiconductors;

4. Core structures and mechanical effects of extended defects specific to semiconductors;

5. The electrical, optical and device effects of dislocations and grain boundaries;

6. Point defect materials problems.


商品描述(中文翻譯)

描述

涵蓋在電子設備開發中特別重要的主題,本書概述了半導體中結構延伸缺陷的特性、效應、角色和表徵。概述了延伸缺陷的基本特性,以及它們對半導體的電子特性的影響、在半導體器件中的角色以及其表徵技術。本書適合材料科學和工程的高年級本科生和研究生,以及研究半導體物理的人士。

目錄

1. 半導體材料;
2. 延伸缺陷簡介;
3. 半導體中延伸缺陷的表徵;
4. 特定於半導體的核心結構和機械效應的延伸缺陷;
5. 位錯和晶界的電學、光學和器件效應;
6. 點缺陷材料問題。