Introduction to Electromagnetic Compatibility, 3/e (Hardcover)
Paul, Clayton R., Scully, Robert C., Steffka, Mark A.
- 出版商: Wiley
- 出版日期: 2022-11-01
- 售價: $2,450
- 貴賓價: 9.8 折 $2,401
- 語言: 英文
- 頁數: 848
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 1119404347
- ISBN-13: 9781119404347
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相關分類:
電磁學 Electromagnetics
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INTRODUCTION TO ELECTROMAGNETIC COMPATIBILITY
The revised new edition of the classic textbook is an essential resource for anyone working with today's advancements in both digital and analog devices, communications systems, as well as power/energy generation and distribution.
Introduction to Electromagnetic Compatibility provides thorough coverage of the techniques and methodologies used to design and analyze electronic systems that function acceptably in their electromagnetic environment. Assuming no prior familiarity with electromagnetic compatibility, this user-friendly textbook first explains fundamental EMC concepts and technologies before moving on to more advanced topics in EMC system design.
This third edition reflects the results of an extensive detailed review of the entire second edition, embracing and maintaining the content that has "stood the test of time", such as from the theory of electromagnetic phenomena and associated mathematics, to the practical background information on U.S. and international regulatory requirements. In addition to converting Dr. Paul's original SPICE exercises to contemporary utilization of LTSPICE, there is new chapter material on antenna modeling and simulation. This edition will continue to provide invaluable information on computer modeling for EMC, circuit board and system-level EMC design, EMC test practices, EMC measurement procedures and equipment, and more such as:
- Features fully-worked examples, topic reviews, self-assessment questions, end-of-chapter exercises, and numerous high-quality images and illustrations
- Contains useful appendices of phasor analysis methods, electromagnetic field equations and waves.
The ideal textbook for university courses on EMC, Introduction to Electromagnetic Compatibility, Third Edition is also an invaluable reference for practicing electrical engineers dealing with interference issues or those wanting to learn more about electromagnetic compatibility to become better product designers.
作者簡介
Clayton R. Paul was Professor and Sam Nunn Chair of Aerospace Systems Engineering at Mercer University and Emeritus Professor of Electrical Engineering at the University of Kentucky, where he served on the faculty for 27 years. Dr. Paul authored twelve textbooks and published numerous technical papers in scientific journals and symposia. He was a Fellow of the IEEE and Honorary Life Member of the IEEE EMC Society.
Robert C. Scully a Principal Electromagnetic Compatibility Engineer, practicing at Jet Propulsion Laboratory (JPL) in Pasadena, CA., previously the Johnson Space Center (JSC) Electromagnetic Compatibility Group Lead Engineer for 20 years. He earned his PhD in Electrical Engineering from the University of Texas at Arlington, USA, and is a Fellow of the IEEE. At JSC, he supported NASA's major space programs including the Space Shuttle, the International Space Station, the Multi-Purpose Crew Vehicle, the Commercial Crew Development Program, and the Gateway Program. At JPL he is currently supporting development of major satellite projects including NISAR and Europa.
Mark A. Steffka is a Professor at the University of Detroit-Mercy. He joined the Electrical and Computer Engineering department as a full-time faculty member after his retirement from General Motors, where spent 20 years in the EMC Group. He received his B.S.E.E. from the University of Michigan and his M.S. from Indiana Wesleyan University. He has over 35 years' experience in the design, development, and testing of military communication systems, aerospace instrumentation, automotive electrical/electronic systems, and vehicle antennas. Steffka is a Senior Member of the IEEE and has co-authored / authored many publications on EMC, Radio Frequency Interference and more.