Precision Measurement of Microwave Thermal Noise
暫譯: 微波熱噪聲的精確測量

Randa, James

  • 出版商: Wiley
  • 出版日期: 2022-11-23
  • 售價: $4,250
  • 貴賓價: 9.5$4,038
  • 語言: 英文
  • 頁數: 200
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 1119910099
  • ISBN-13: 9781119910091
  • 相關分類: 微波工程 Microwave
  • 海外代購書籍(需單獨結帳)

商品描述

Precision Measurement of Microwave

Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties

Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author's expertise of calculations to aid understanding of the challenges and solutions.

The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed.

Specific topics and concepts covered in the text include:

  • Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources
  • Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies
  • On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties
  • Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio

Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.

商品描述(中文翻譯)

微波的精確測量

全面資源涵蓋精確噪聲測量的基礎和分析,並詳細處理其不確定性

微波熱噪聲的精確測量介紹了在微波頻率下精確測量熱噪聲的基本知識,並指導讀者如何評估此類測量中的不確定性。重點是美國國家標準與技術研究所(NIST)使用的測量方法,但這些一般原則和方法在廣泛的應用中都很有用。讀者將學習如何使用受尊敬的作者的計算專業知識來執行準確的微波噪聲測量,以幫助理解挑戰和解決方案。

文本涵蓋了分析測量所需的背景知識以及用於校準無線頻率和微波輻射計的標準。它還涵蓋了噪聲溫度(功率)和放大器及晶體管的噪聲特性測量。除了通常的室溫雙端口設備外,還討論了低溫設備和多端口放大器。最後,考慮了這些實驗室基礎測量與遙感測量(特別是來自太空的測量)之間的聯繫,並討論了實驗室基礎測量對遙感應用的可能貢獻。

文本中涵蓋的具體主題和概念包括:


  • 噪聲溫度標準,涵蓋環境標準、熱(烘箱)標準、低溫標準及其他標準和噪聲源

  • 放大器噪聲,涵蓋噪聲參數的定義、噪聲參數的測量、噪聲參數測量的不確定性分析,以及模擬和策略

  • 晶圓上的噪聲測量,涵蓋晶圓上的微波形式、噪聲溫度、晶圓上的噪聲參數測量及不確定性

  • 多端口放大器,涵蓋形式和噪聲矩陣、多端口的噪聲指標定義,以及信噪比的降級


包含一些入門材料的微波熱噪聲的精確測量是高級學生和所有在(或進入)微波噪聲測量領域工作的專業人士(無論是在標準實驗室、商業實驗室還是學術研究中)不可或缺的資源。

作者簡介

James Randa received the Ph.D. degree in Theoretical Physics from the University of Illinois at Urbana-Champaign, USA. After a series of postdoctoral and temporary faculty positions, he joined NIST, where he worked for about 25 years, leading the Noise Project for much of that time. Since his retirement he has continued to work on topics in noise on a part-time basis, as a contractor and/or a guest researcher at NIST. He is a Senior Member of the IEEE.

作者簡介(中文翻譯)

詹姆斯·蘭達於美國伊利諾伊大學香檳分校獲得理論物理學博士學位。在經歷了一系列的博士後和臨時教職後,他加入了國家標準與技術研究所(NIST),在那裡工作了約25年,並在大部分時間內領導噪音專案。自從退休以來,他仍然以兼職的方式繼續研究噪音相關主題,擔任NIST的承包商和/或客座研究員。他是IEEE的資深會員。