Design for High Performance, Low Power, and Reliable 3D Integrated Circuits
暫譯: 高效能、低功耗及可靠的3D集成電路設計
Sung Kyu Lim
- 出版商: Springer
- 出版日期: 2014-12-16
- 售價: $4,840
- 貴賓價: 9.5 折 $4,598
- 語言: 英文
- 頁數: 560
- 裝訂: Paperback
- ISBN: 1489986960
- ISBN-13: 9781489986962
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商品描述
This book provides readers with a variety of algorithms and software tools, dedicated to the physical design of through-silicon-via (TSV) based, three-dimensional integrated circuits. It describes numerous “manufacturing-ready” GDSII-level layouts of TSV-based 3D ICs developed with the tools covered in the book. This book will also feature sign-off level analysis of timing, power, signal integrity, and thermal analysis for 3D IC designs. Full details of the related algorithms will be provided so that the readers will be able not only to grasp the core mechanics of the physical design tools, but also to be able to reproduce and improve upon the results themselves. This book will also offer various design-for-manufacturability (DFM), design-for-reliability (DFR), and design-for-testability (DFT) techniques that are considered critical to the physical design process.
商品描述(中文翻譯)
本書為讀者提供各種演算法和軟體工具,專注於基於通孔 (through-silicon-via, TSV) 的三維集成電路的物理設計。書中描述了許多“製造就緒”級別的 GDSII 佈局,這些佈局是使用書中涵蓋的工具開發的。此書還將包含對三維集成電路設計的時序、功耗、信號完整性和熱分析的簽核級別分析。將提供相關演算法的詳細資訊,以便讀者不僅能掌握物理設計工具的核心機制,還能重現並改進結果。本書還將提供各種被認為對物理設計過程至關重要的可製造性設計 (design-for-manufacturability, DFM)、可靠性設計 (design-for-reliability, DFR) 和可測試性設計 (design-for-testability, DFT) 技術。