Reliability Prediction for Microelectronics
暫譯: 微電子可靠性預測

Bernstein, Joseph B., Bensoussan, Alain, Bender, Emmanuel

Reliability Prediction for Microelectronics
  • 出版商: Wiley
  • 出版日期: 2024-02-20
  • 定價: $4,500
  • 售價: 9.5 折 $4,275
  • 語言: 英文
  • 頁數: 400
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 1394210930
  • ISBN-13: 9781394210930
  • 相關分類: 微電子學 Microelectronics

    • 立即出貨 (庫存=1)

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商品描述

RELIABILITY PREDICTION FOR MICROELECTRONICS

Wiley Series in Quality & Reliability Engineering

REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK

Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability.

Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing.

Reliability Prediction for Microelectronics readers will also find:

  • Focus on the tools required to perform reliability assessments in real operating conditions
  • Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more
  • New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI

Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

商品描述(中文翻譯)

**微電子可靠性預測**

**Wiley 品質與可靠性工程系列**

**用這本突破性的書籍徹底改變您對可靠性評估的看法**

可靠性評估是工程中的一個關鍵方面，沒有它，就無法保證機器在其壽命內在期望參數範圍內的安全性能。特別是在微電子領域，評估可靠性的挑戰相當巨大，而建立微電子可靠性標準的統計方法也相當複雜。隨著納米級微電子設備在現代生活中越來越重要，了解可用於評估可靠性的工具變得比以往任何時候都更為重要。

《微電子可靠性預測》滿足了這一需求，提供了一系列圍繞可靠性物理原則和剩餘使用壽命（RUL）概念構建的工具。它的核心主題是「失效物理」，結合了對傳統可靠性評估方法的深入理解以及對其盲點的敏銳認識。它使工程師和研究人員具備克服數十年錯誤的可靠性物理的能力，並將他們的工作建立在堅實的工程基礎上。

《微電子可靠性預測》的讀者還將發現：

- 專注於在實際操作條件下進行可靠性評估所需的工具
- 詳細討論包括失效基礎、可靠性測試、加速因子計算等主題
- 有關 DSM 技術的新多物理失效，包括 TDDB、EM、HCI 和 BTI

《微電子可靠性預測》非常適合希望了解產品設計和測試這一關鍵領域的可靠性和品質工程師、設計工程師以及高級工程學生。

作者簡介

JOSEPH B. BERNSTEIN, PHD, is Director of the Laboratory for Failure Analysis and Reliability of Electronic Systems at Ariel University, Israel. He has worked and published extensively on failure analysis and defect avoidance in microelectronics, and is a senior member of IEEE.

ALAIN A. BENSOUSSAN, PHD, is a Consulting Reliability Engineer with decades of experience as an Expert on Optics and Opto-Electronics Parts at Thales Alenia Space. He has conducted research in many areas of microelectronics reliability and physics of failure.

EMMANUEL BENDER, PHD, completed his PhD in Electrical and Electronics Engineering, specializing in Microelectronics Reliability, at Ariel University, Israel, in 2022.

作者簡介(中文翻譯)

約瑟夫·B·伯恩斯坦（JOSEPH B. BERNSTEIN），博士 是以色列阿里爾大學電子系統失效分析與可靠性實驗室的主任。他在微電子學的失效分析和缺陷避免方面有廣泛的工作和出版經驗，並且是IEEE的資深會員。

阿蘭·A·本蘇桑（ALAIN A. BENSOUSSAN），博士 是一位顧問可靠性工程師，擁有數十年的光學和光電元件專家經驗，曾在泰雷茲阿雷尼亞太空公司工作。他在微電子可靠性和失效物理的多個領域進行過研究。

艾曼紐·本德（EMMANUEL BENDER），博士 於2022年在以色列阿里爾大學完成了電氣與電子工程博士學位，專攻微電子可靠性。

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