Electrical Overstress (EOS): Devices, Circuits and Systems (Hardcover)

Steven H. Voldman

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商品描述

Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.  This bookteaches the fundamentals of electrical overstress  and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design.  It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world.

Look inside for extensive coverage on:

  • Fundamentals of  electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA),  to physical models for EOS phenomena
  • EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures
  • EOS failures in both semiconductor devices, circuits and system
  • Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events)
  • EOS  protection on-chip design practices and how they differ from ESD protection networks and solutions
  • Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment
  • Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD
  • EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems
  • EOS testing and qualification techniques, and
  • Practical off-chip ESD protection and system level solutions to provide more robust systems

Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

商品描述(中文翻譯)

電氣過壓(EOS)持續影響著從微電子到納米電子的半導體製造、半導體元件和系統的技術。本書教授了電氣過壓的基礎知識,以及如何最小化和減輕EOS故障。本書清晰地介紹了EOS現象、EOS起源、EOS來源、EOS物理、EOS故障機制以及芯片和系統設計中的EOS。它深入探討了製造中EOS的來源,以及在芯片和系統級別上集成EOS保護網絡的例子。本書獨特之處在於涵蓋了從芯片設計和電子設計自動化到現代工廠級EOS計劃管理的EOS製造問題。

詳細內容包括:
- 電氣過壓的基礎知識,從EOS物理、EOS時間尺度、安全操作區域(SOA)到EOS現象的物理模型
- 現今半導體製造環境中的EOS來源,以及避免EOS故障的EOS計劃管理、處理和EOS審計處理
- 半導體器件、電路和系統中的EOS故障
- 如何區分EOS事件和靜電放電(ESD)事件(例如人體模型(HBM)、充電器件模型(CDM)、電纜放電事件(CDM)、充電板事件(CBE)以及系統級IEC 61000-4-2測試事件)
- 芯片設計中的EOS保護實踐及其與ESD保護網絡和解決方案的區別
- 印刷電路板(PCB)和製造設備中的EOS系統級問題
- 現代數字、模擬和功率技術(包括CMOS、LDMOS和BCD)中的EOS問題示例
- EOS設計規則檢查(DRC)、LVS和ERC電子設計自動化(EDA)以及它與ESD EDA系統的區別
- EOS測試和驗證技術
- 提供更強大系統的實用離芯ESD保護和系統級解決方案

《電氣過壓(EOS):器件、電路和系統》是作者關於ESD保護的系列書籍的延續。它是一本必備的參考資料,對於我們進入納米電子時代所面臨的問題提供了有用的見解。