Theory and Practice of Thermal Transient Testing of Electronic Components (Hardcover)

This book discusses all of the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details, and then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions of the measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are discussed in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics, and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.

本書討論了熱暫態測試的所有主要方面，這是當今最重要的電子熱特性測試方法。本書首先介紹了從測量結果中創建結構函數的理論背景，並提供了數學細節，然後展示了該方法如何用於熱合格性測試、結構完整性測試、確定材料參數和模擬模型校準。本書討論了測量的一般實際問題，以幫助初學者進行熱暫態測試。並通過各種使用案例詳細討論了使用各種電子元件進行測量的特殊問題和技巧，例如Si二極管、雙極性晶體管、MOS晶體管、IGBT器件、電阻器、電容器、寬帶隙材料和LED等。這本實用手冊將使讀者能夠對任何新型電子產品進行熱暫態測試，並提供理論細節以了解該方法所提供的機會和限制。本書將成為實踐工程師、學生和研究人員的寶貴參考資料。

​Márta Rencz, PhD, is a Professor and former Head of the Department of Electron Devices at the Budapest University of Technology and Economics. Dr. Rencz also holds a Research Director position with Mentor, a Siemens Business. She received her undergraduate and master degrees in electrical engineering and a PhD from the Technical University of Budapest, Hungary, the Doctor of Science degree from The Hungarian Academy of Science, and the Doctor Honoris Causa Degree from the Technical University of Tallinn. Her latest research interests include the thermal investigation of ICs and MEMS, thermal sensors, thermal testing, thermal simulation, multiphysics model generation, and electro-thermal simulation. Dr. Rencz received the Harvey Rosten Award of Excellence for her research results in thermal modelling and the ASME Allan Krauss Thermal Management Medal for her contributions to the scientific and academic world of thermal transient testing, in particular, her work on thermal metrology including thermal test, characterization, and analysis of semiconductor devices and packages. She is Program Committee member for several international conferences and workshops and a guest editor of special issues at leading scientific journals. She has published her theoretical and practical results in more than 350 technical papers.

Márta Rencz博士是匈牙利布達佩斯科技與經濟大學電子元件系的教授和前系主任。Rencz博士還擔任西門子旗下Mentor公司的研究總監職位。她在匈牙利布達佩斯科技大學獲得了電氣工程的學士和碩士學位，並在匈牙利科學院獲得了博士學位，以及在塔林科技大學獲得了名譽博士學位。她目前的研究興趣包括集成電路和微機電系統的熱特性研究、熱傳感器、熱測試、熱模擬、多物理模型生成和電熱模擬。Rencz博士因其在熱建模方面的研究成果獲得了Harvey Rosten卓越研究獎，並因其對熱瞬態測試的科學和學術貢獻，特別是在半導體器件和封裝的熱測試、表徵和分析方面的工作，獲得了ASME Allan Krauss熱管理獎章。她是多個國際會議和研討會的程序委員會成員，並擔任領先科學期刊的特別專題編輯。她已在350多篇技術論文中發表了她的理論和實踐成果。